36 automatic neasurements, of which an unlimited number can be displayed at once as either individual measurement badges or collectively in a measurement results table. Amplitude, Maximum, Minimum, Peak-to-Peak, Positive Overshoot, Negative Overshoot, Mean, RMS, AC RMS, Top, Base, and Area. Period, Frequency, Unit Interval, Data Rate, Positive Pulse Width, Negative Pulse Width, Skew, Delay, Rise Time, Fall Time, Phase, Rising Slew Rate, Falling Slew Rate, Burst Width, Positive Duty Cycle, Negative Duty Cycle, Time Outside Level, Setup Time, Hold Time, Duration N-Periods, High Time, and Low Time. TIE and Phase Noise. Mean, Standard Deviation, Maximum, Minimum, and Population. Statistics are available on both the current acquisition and all acquisitions. User-definable reference levels for automatic measurements can be specified in either percent or units. Reference levels can be set to global for all measurements, per source or unique for each measurement. Isolate the specific occurrence within an acquisition to take measurements on, using either the screen or waveform cursors. Gating can be set to global for all measurements or unique for each measurement. Time Trend, Histogram, and Spectrum plots are available for all standard measurements.
FastFrame™ Segmented Memory enables you to make efficient use of the oscilloscope’s acquisition memory by capturing many trigger events in a single record while eliminating the large time gaps between events of interest. View and measure the segments individually or as an overlay.
Sign Up for our Test & Measurement Tips Enewsletter: